Since its introduction as an industry standard in 1990, boundary-scan (also known as JTAG) has enjoyed growing popularity for board level manufacturing test applications.
Boundary-scan has rapidly become the technology of choice for building reliable high technology electronic products with a high degree of testability. Due to the low-cost and IC level access capabilities of boundary-scan, its use has expanded beyond traditional board test applications into product design and service.
This blog provides a brief overview of the boundary-scan architecture and the new technology trends that make using boundary-scan essential for dramatically reducing development and production costs. We will also describe the various uses of boundary-scan and its application.
A JTAG enthusiast, I am providing an overview of the JTAG architecture and the new technology trends that make using boundary-scan essential for
dramatically reducing development and production costs. I also describe the
various uses of JTAG and the tools available today for supporting
boundary-scan technology.
Read how JTAG boundary-scan technology can be applied to the whole product life
cycle including product design, prototype debugging, production, and field
service. This means the cost of the boundary-scan tools can be amortized over
the entire product life cycle, not just the production phase.
2 comments:
How about some tutorial on BSDL, and how to generate it for a device that will go on a board?
JMF
DFT Digest
Well if you really want questions
1) How do designers create their boundary scan logic and bsdl file? Do you use commercial tools or home grown scripts?
2) What do you do with the trst_n pin? do you pull it up or down?
3) How are designers extending jtag to include on chip instrumentation bist etc.
4) Why is the safe bit for a control cell required to match the disable state?
5) Where can you get good inexpensive jtag probes and software
John Eaton
Post a Comment