DFT Digest is a weblog about electronics Design-for-Test to discuss state-of-the-art DFT methods, technologies and best-practices, with the ultimate aim of better understanding design-for-test through the increased participation of the greater DFT community.
They are starting to offer tutorial materials and links to resources on DFT there: DFT Digest
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About Me
- JTAG
- A JTAG enthusiast, I am providing an overview of the JTAG architecture and the new technology trends that make using boundary-scan essential for
dramatically reducing development and production costs. I also describe the
various uses of JTAG and the tools available today for supporting
boundary-scan technology.
Read how JTAG boundary-scan technology can be applied to the whole product life cycle including product design, prototype debugging, production, and field service. This means the cost of the boundary-scan tools can be amortized over the entire product life cycle, not just the production phase.
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